Euclidean Distance Mapping for computing microstructural gradients at interfaces in composite materials

Cement and Concrete Research

Volumn 36, Issue 6, 2006, Pages 1091-1097

  Wong, H S ^a   Buenfeld, N R ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Backscattered electron imaging; Euclidean distance map; Image analysis; Interfacial transition zone; Microstructure

Indexed keywords

BOUNDARY CONDITIONS; CALCIUM COMPOUNDS; IMAGE ANALYSIS; INTERFACES (MATERIALS); MICROSTRUCTURE;

AGGREGATE PARTICLES; BACKSCATTERED ELECTRON IMAGING; EUCLIDEAN DISTANCE MAP; INTERFACIAL TRANSITION ZONE;

COMPOSITE MATERIALS;

EID: 33646833244     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cemconres.2005.10.003     Document Type: Article

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