Space charge cartography by FLIMM on SEM-irradiated PTFE thin films

Journal of Electrostatics

Volumn 64, Issue 7-9, 2006, Pages 492-497

  Petre, A ^a   Marty Dessus, D ^a   Berquez, L ^a   Franceschi, J L ^a  

^a UNIVERSITÉ PAUL SABATIER   (France)

Author keywords

Electron beam; FLIMM; Polymers; SEM; Space charge

Indexed keywords

ELECTRON BEAMS; LASER BEAM EFFECTS; POLYTETRAFLUOROETHYLENES; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

CHARGE BOXES; FOCUSED LASER-INTENSITY MODULATION METHOD;

ELECTRIC SPACE CHARGE;

ELECTRIC SPACE CHARGE; ELECTRON BEAMS; LASER BEAM EFFECTS; POLYTETRAFLUOROETHYLENES; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

EID: 33646815665     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2005.10.030     Document Type: Article

References (6)

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