Sensitivity of the Halstead and Wechsler test batteries to brain damage: Evidence from Reitan's original validation sample

Clinical Neuropsychologist

Volumn 20, Issue 2, 2006, Pages 221-229

  Loring, David W ^a   Larrabee, Glenn J ^b  

^a UNIVERSITY OF FLORIDA   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADULT; ANXIETY DISORDER; ARTICLE; BRAIN ABSCESS; BRAIN ATROPHY; BRAIN DAMAGE; BRAIN TUMOR; CEREBROVASCULAR ACCIDENT; CEREBROVASCULAR DISEASE; CLINICAL ARTICLE; CONTROLLED STUDY; DEMENTIA; DEPRESSION; EDUCATION; EPILEPSY; FEMALE; HALSTEAD TEST; HEAD INJURY; HUMAN; MALE; NEUROPSYCHOLOGICAL TEST; OBSESSIVE COMPULSIVE DISORDER; PARAMETRIC TEST; PARAPLEGIA; SENSITIVITY AND SPECIFICITY; SUBDURAL HEMATOMA; VALIDATION STUDY; WECHSLER INTELLIGENCE SCALE;

ADULT; BRAIN DAMAGE, CHRONIC; CASE-CONTROL STUDIES; FEMALE; HUMANS; INTELLIGENCE TESTS; MALE; NEUROPSYCHOLOGICAL TESTS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 33646772517     PISSN: 13854046     EISSN: 17444144     Source Type: Journal    
DOI: 10.1080/13854040590947443     Document Type: Article

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