Anomalous positive exchange bias in Ni80Fe20/Ni xFe1-xO thin-film bilayers induced by ion-beam deposition effects

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Van Lierop, J ^a   Lin, K W ^b   Ouyang, H ^b   Tzeng, Y M ^b   Guo, Z Y ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; CRYSTALLINE MATERIALS; HYSTERESIS; ION BEAMS; MAGNETIC PROPERTIES; THERMAL EFFECTS;

INTERFACIAL PINNING; ION-BEAM DEPOSITION; MAGNETIC PHASES; THIN-FILM BILAYERS;

THIN FILMS;

EID: 33646752316     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2162034     Document Type: Article

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