Uniformity testing using minimal spanning tree

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 4, 2002, Pages 281-284

  Jain, Anil K ^a   Xiaowei, Xu ^a   Tin, Kam Ho ^b   Fan, Xiao ^a  

^a Michigan State University   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PATTERN RECOGNITION SYSTEMS; TREES (MATHEMATICS); TESTING;

DEGREE OF UNIFORMITY; EDGE INCONSISTENCY; PATTERN ANALYSIS;

PATTERN RECOGNITION;

CLUSTERED DATUM; EDGE LENGTH; MINIMAL SPANNING TREE; MULTIVARIATE DATA; PATTERN ANALYSIS; RESAMPLING METHOD; SUB-SAMPLES; UNIFORMITY TESTING;

EID: 33646749712     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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