Effect of varying sputtering parameters on the observation of magnetic domains using high-resolution Bitter microscopy technique

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Shah, Prasanna ^a   Gavrin, A ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BITTER MICROSCOPY; GAS PRESSURE; SPUTTERING PARAMETERS;

IRON; MAGNETIC PROPERTIES; OPTICAL MICROSCOPY; QUANTUM OPTICS; SPUTTERING;

NANOSTRUCTURED MATERIALS;

EID: 33646739465     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2167062     Document Type: Article

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