Local secondary-electron emission spectra via scanning probe energy loss spectroscopy

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Volumn 2, Issue 6, 2006, Pages 744-746

  Yin, Jinlong ^a   Pulisciano, Adriano ^a   Palmer, Richard E ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Electron energy loss spectroscopy; Field emission; Scanning tunneling microscopy; Secondary electrons; Surface analysis

Indexed keywords

ELECTRIC FIELDS; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAPHITE; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

FIELD EMISSIONS; SECONDARY ELECTRONS; SURFACE ANALYSIS;

SECONDARY EMISSION;

GRAPHITE; NANOMATERIAL;

ARTICLE; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; SPECTROMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

GRAPHITE; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; NANOSTRUCTURES; NANOTECHNOLOGY; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES;

EID: 33646730999     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200500491     Document Type: Article

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