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Volumn 99, Issue 8, 2006, Pages
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Compositional dependencies of ferromagnetic Ge1-x Mnx Te grown by solid-source molecular-beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIFERROELECTRIC MATERIALS;
HIGH ENERGY ELECTRON DIFFRACTION;
MANGANESE;
MOLECULAR BEAM EPITAXY;
SEMICONDUCTING GERMANIUM COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
FERROMAGNETIC GE1-X MNX TE;
IN SITU REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION;
SOLID-SOURCE MOLECULAR-BEAM EPITAXY;
FERROMAGNETIC MATERIALS;
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EID: 33646724862
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2170072 Document Type: Article |
Times cited : (25)
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References (13)
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