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Volumn 41, Issue 6, 2005, Pages 839-842

Fracture of layered gallium and indium chalcogenides

Author keywords

[No Author keywords available]

Indexed keywords

FRACTOGRAPHIC INVESTIGATIONS; FRACTURE SURFACES; MECHANICAL LOADING;

EID: 33646721122     PISSN: 1068820X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11003-006-0050-4     Document Type: Article
Times cited : (2)

References (13)
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    • V. V. Panasyuk (editor), Karpenko Physicomechanical Institute, Ukrainian Academy of Sciences, Lviv
    • M. Schaper, M. Jurisch, F. Bergner, and R. Hammer, "Fracture mechanical strength evaluation of GaAs and Si wafers GaAs," in: V. V. Panasyuk (editor), Fracture Mechanics of Materials and Structural Integrity [in Russian], Karpenko Physicomechanical Institute, Ukrainian Academy of Sciences, Lviv (2004), pp. 593-598.
    • (2004) Fracture Mechanics of Materials and Structural Integrity [in Russian] , pp. 593-598
    • Schaper, M.1    Jurisch, M.2    Bergner, F.3    Hammer, R.4
  • 3
    • 1842469555 scopus 로고
    • Crack resistance of crystalline and composite superhard materials
    • N. V. Novikov and A. L. Maistrenko, "Crack resistance of crystalline and composite superhard materials," Fiz.-Khim. Mekh. Mater., 19, No. 4, 46-53 (1983).
    • (1983) Fiz.-khim. Mekh. Mater. , vol.19 , Issue.4 , pp. 46-53
    • Novikov, N.V.1    Maistrenko, A.L.2
  • 4
    • 3543003466 scopus 로고    scopus 로고
    • Degradation and fracture of crystals of gallium and indium selenides
    • O.O. Balyts'kyi, "Degradation and fracture of crystals of gallium and indium selenides," Mater. Sci., 39, No. 4, 561-565 (2003).
    • (2003) Mater. Sci. , vol.39 , Issue.4 , pp. 561-565
    • Balyts'kyi, O.O.1
  • 5
    • 21644438832 scopus 로고    scopus 로고
    • Elastic characteristics of laminated gallium and indium chalcogenides
    • O.O. Balyts'kyi, "Elastic characteristics of laminated gallium and indium chalcogenides," Mat. Sci., 40, No. 5, 706-709 (2004).
    • (2004) Mat. Sci. , vol.40 , Issue.5 , pp. 706-709
    • Balyts'kyi, O.O.1
  • 6
    • 33646721693 scopus 로고    scopus 로고
    • Mechanical properties, adhesion, and fracture toughness of low-K dielectric thin films for microelectronic applications
    • (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier
    • I. S. Adhihetty, J. B. Vella, A. A. Volinsky, et al., "Mechanical properties, adhesion, and fracture toughness of low-K dielectric thin films for microelectronic applications," in: Proceedings of the 10 th International Conf. on Fracture (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier (2002), p. 532.
    • (2002) Proceedings of the 10th International Conf. on Fracture , pp. 532
    • Adhihetty, I.S.1    Vella, J.B.2    Volinsky, A.A.3
  • 8
    • 33646743504 scopus 로고    scopus 로고
    • Fracture and multi-scale simulations of thin-film structures
    • (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier
    • R. H. Dauskardt, "Fracture and multi-scale simulations of thin-film structures," in: Proceedings of the 10th International Conf. on Fracture (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier (2002), p. 572.
    • (2002) Proceedings of the 10th International Conf. on Fracture , pp. 572
    • Dauskardt, R.H.1
  • 9
    • 33646722210 scopus 로고    scopus 로고
    • Fracture and creep rupture behaviour of notched oxide/oxide and SiC/SiC CMC
    • (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier
    • J. Reji, D. J. Buchanan, and L. P. Zawada, "Fracture and creep rupture behaviour of notched oxide/oxide and SiC/SiC CMC," in: Proceedings of the 10 th International Conf. on Fracture (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier (2002), p. 530.
    • (2002) Proceedings of the 10th International Conf. on Fracture , pp. 530
    • Reji, J.1    Buchanan, D.J.2    Zawada, L.P.3
  • 10
    • 33646721079 scopus 로고    scopus 로고
    • Fatigue crack growth behavior of micro-sized specimens prepared from amorphous alloy thin films
    • (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier
    • K. Takashima, Y. Higo, and M. V. Swain, "Fatigue crack growth behavior of micro-sized specimens prepared from amorphous alloy thin films," in: Proceedings of the 10th International Conf. on Fracture (Honolulu, Hawaii, Dec. 2-6, 2001), Elsevier (2002), p. 127.
    • (2002) Proceedings of the 10th International Conf. on Fracture , pp. 127
    • Takashima, K.1    Higo, Y.2    Swain, M.V.3
  • 11
    • 0020901363 scopus 로고
    • Polytypism in the III-VI layer compounds
    • J. C. J. M. Terhell, "Polytypism in the III-VI layer compounds," Progr. Ctyst. Growth Charact., 7, 55-110 (1983).
    • (1983) Progr. Ctyst. Growth Charact. , vol.7 , pp. 55-110
    • Terhell, J.C.J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.