-
2
-
-
79956041724
-
-
B. Ravel, J. O. Cross, M. P. Raphael, V. G. Harris, R. Ramesh, and V. Saraf, Appl. Phys. Lett. 81, 2812 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 2812
-
-
Ravel, B.1
Cross, J.O.2
Raphael, M.P.3
Harris, V.G.4
Ramesh, R.5
Saraf, V.6
-
3
-
-
0037594159
-
-
K. Inomata, S. Okamura, R. Goto, and N. Tezuka, Jpn. J. Appl. Phys., Part 2 42, L419 (2003).
-
(2003)
Jpn. J. Appl. Phys., Part 2
, vol.42
, pp. 419
-
-
Inomata, K.1
Okamura, S.2
Goto, R.3
Tezuka, N.4
-
4
-
-
3242679924
-
-
S. Kämmerer, A. Thomas, A. Hütten, and G. Reiss, Appl. Phys. Lett. 85, 79 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 79
-
-
Kämmerer, S.1
Thomas, A.2
Hütten, A.3
Reiss, G.4
-
5
-
-
4644333890
-
-
H. Kubota, J. Nakata, M. Oogane, Y. Ando, A. Sakuma, and T. Miyazaki, Jpn. J. Appl. Phys., Part 2 43, L984 (2004).
-
(2004)
Jpn. J. Appl. Phys., Part 2
, vol.43
, pp. 984
-
-
Kubota, H.1
Nakata, J.2
Oogane, M.3
Ando, Y.4
Sakuma, A.5
Miyazaki, T.6
-
6
-
-
27744487583
-
-
0021-4922 10.1143/JJAP.44.L521
-
T. Marukame, T. Kasahara, K. Matsuda, T. Uemura, and M. Yamamoto, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.44.L521 44, L521 (2005); T. Marukame, T. Kasahara, K. Matsuda, T. Uemura, and M. Yamamoto, IEEE Trans. Magn. 41, 2603 (2005).
-
(2005)
Jpn. J. Appl. Phys., Part 2
, vol.44
, pp. 521
-
-
Marukame, T.1
Kasahara, T.2
Matsuda, K.3
Uemura, T.4
Yamamoto, M.5
-
7
-
-
27744489926
-
-
T. Marukame, T. Kasahara, K. Matsuda, T. Uemura, and M. Yamamoto, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.44.L521 44, L521 (2005); T. Marukame, T. Kasahara, K. Matsuda, T. Uemura, and M. Yamamoto, IEEE Trans. Magn. 41, 2603 (2005).
-
(2005)
IEEE Trans. Magn.
, vol.41
, pp. 2603
-
-
Marukame, T.1
Kasahara, T.2
Matsuda, K.3
Uemura, T.4
Yamamoto, M.5
-
9
-
-
0000837368
-
-
S. Ishida, S. Fujii, S. Kashiwagi, and S. Asano, J. Phys. Soc. Jpn. 64, 2152 (1995).
-
(1995)
J. Phys. Soc. Jpn.
, vol.64
, pp. 2152
-
-
Ishida, S.1
Fujii, S.2
Kashiwagi, S.3
Asano, S.4
-
13
-
-
34547626151
-
-
R. A. Groot, F. M. Mueller, P. G. van Engen, and K. H. J. Buschow, Phys. Rev. Lett. 50, 2024 (1985).
-
(1985)
Phys. Rev. Lett.
, vol.50
, pp. 2024
-
-
Groot, R.A.1
Mueller, F.M.2
Van Engen, P.G.3
Buschow, K.H.J.4
-
14
-
-
18644374382
-
-
J. Schmalhorst, S. Kämmerer, G. Reiss, and A. Hütten, Appl. Phys. Lett. 86, 052501 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.86
, pp. 052501
-
-
Schmalhorst, J.1
Kämmerer, S.2
Reiss, G.3
Hütten, A.4
-
15
-
-
33646722187
-
-
T. Ishikawa, T. Marukame, K.-I. Matsuda, T. Uemura, and M. Yamamoto, "Structural and magnetic properties of epitaxially grown full-Heusler alloy Co2 MnGe thin films deposited using magnetron sputtering," Paper No. 050562GD04R, J. Appl. Phys. (these proceedings).
-
J. Appl. Phys.
-
-
Ishikawa, T.1
Marukame, T.2
Matsuda, K.-I.3
Uemura, T.4
Yamamoto, M.5
-
17
-
-
19544367599
-
-
C. Tiusan, J. Faure-Vincent, C. Bellouard, M. Hehn, E. Jouguelet, and A. Schuhl, Phys. Rev. Lett. 93, 106602 (2004).
-
(2004)
Phys. Rev. Lett.
, vol.93
, pp. 106602
-
-
Tiusan, C.1
Faure-Vincent, J.2
Bellouard, C.3
Hehn, M.4
Jouguelet, E.5
Schuhl, A.6
|