Intrinsic nonlinearity probed by intermodulation distortion microwave measurements on high quality MgB 2 thin films

Applied Physics Letters

Volumn 88, Issue 14, 2006, Pages

  Cifariello, G ^a   Aurino, M ^a   Di Gennaro, E ^a   Lamura, G ^a   Andreone, A ^a   Orgiani, P ^b,d   Xi, X X ^b   Villagier J C ^c  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c CEA GRENOBLE   (France)

^d Laboratorio Regionale SuperMat   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRICALLY LOADED COPPER; INTERMODULATION DISTORTIONS; INTERMODULATION PRODUCTS; MICROWAVE MEASUREMENTS;

CHEMICAL VAPOR DEPOSITION; DIELECTRIC MATERIALS; DISTORTION (WAVES); MICROWAVE ACOUSTICS; SUPERCONDUCTING DEVICES; THIN FILMS;

MODULATION;

EID: 33646708768     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2193053     Document Type: Article

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