Probing the electronic structure of Ni-X, (X = B, S, P) catalysts with XPS

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 238-242

  Diplas, S ^a   Jorgensen S ^a   Tafto J ^a   Tonnessen T ^b   Knutsen, T ^b   Lehrmann, J ^b   Valand T ^b   Abel, M L ^c   Watts, J F ^c  

^a UNIVERSITY OF OSLO   (Norway)

^b UNIVERSITY OF AGDER   (Norway)

^c UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Electronic structure; Ni alloys; XPS

Indexed keywords

ALLOYING; CARRIER CONCENTRATION; ELECTRODEPOSITION; ELECTRONIC STRUCTURE; POLYCRYSTALLINE MATERIALS; SATELLITES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PARAMETER (AP); ENERGY SHIFTS;

NICKEL ALLOYS;

EID: 33646700029     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2322     Document Type: Conference Paper

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