High sensitivity surface plasmon resonance sensor based on phase interrogation at optimal incident wavelengths

Applied Physics Letters

Volumn 88, Issue 14, 2006, Pages

  Chiang, Hai Pang ^a   Lin, Jing Lun ^a   Chen, Zhi Wei ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; MONITORING; OPTICAL VARIABLES CONTROL; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE;

INCIDENT WAVELENGTHS; PHASE INTERROGATION; SURFACE PLASMON RESONANCE EXCITATION; WAVELENGTH MEASUREMENT;

OPTICAL SENSORS;

EID: 33646693437     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2192622     Document Type: Article

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