Homodyne scanning holography

Optics Express

Volumn 14, Issue 10, 2006, Pages 4280-4285

  Rosen, Joseph ^a,d   Indebetouw, Guy ^b,d   Brooker, Gary ^c  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^c JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE   (United States)

^d JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; INTERFEROMETERS; LINEAR SYSTEMS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PROBLEM SOLVING;

FRESNEL HOLOGRAM; FRESNEL ZONE PLATES (FZP); HOMODYNE SCANNING HOLOGRAPHY;

HOLOGRAPHY;

EID: 33646589317     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.004280     Document Type: Article

References (5)

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3. G. Indebetouw, A. El Maghnouji, and R. Foster, "Scanning holographic microscopy with transverse resolution exceeding the Rayleigh limit and extended depth of focus," J. Opt. Soc. Am. A 22, 892-898 (2005).
4. G. Indebetouw, P. Klysubun, T. Kim, and T.-C. Poon, "Imaging properties of scanning holographic microscopy," J. Opt. Soc. Am. A 17, 380-390 (2000).
5. J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, New York, 1996), 126-165.