TEM and XANES investigations and optical properties of SnO nanolayers

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 514-517

  Domashevskaya, E P ^a   Chuvenkova, O A ^a   Kashkarov, V M ^a   Kushev, S B ^b   Ryabtsev, S V ^a   Turishchev, S Yu ^a   Yurakov, Yu A ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

^b VORONEZH STATE TECHNICAL UNIVERSITY   (Russian Federation)

Author keywords

Microstructure; Optical absorption edges; Phase composition; Tin oxides; Transmission electron microscopy; X ray absorption near edge structure

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OXIDATION; OXIDES; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS MEMBRANE; OPTICAL ABSORPTION EDGES; PHASE BOUNDARIES; TIN MONOXIDE; TIN OXIDES; X-RAY ABSORPTION NEAR EDGE STRUCTURE;

TIN COMPOUNDS;

EID: 33646588378     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2307     Document Type: Conference Paper

References (19)

1. JCPDS - ICDD, 1995, PDF-2 Sets 1-45 database, Newton Square, PA 19073, USA, card N 6-395.
2. JCPDS - ICDD, 1995, PDF-2 Sets 1-45 database, Newton Square, PA 19073, USA, card N 41-1445.
3. Çetin K, Zunger A. Phys. Rev. Lett. 2002; 88: 095501.
4. Peltzer y Biancá EL, Svane A, Christensen NE, Rodriguez CO, Cappannini OM, Moreno MS. Phys. Rev., B 1993; 48: 15712.
5. De A, Ray S. J. Phys. D: Appl. Phys. 1991; 24: 719.
6. Pan XQ, Fu L. J. Electroceramics 2001; 7: 35.
7. Nemoshkalenko VA, Aleshin VG. Theoretical Basics of X-Ray Emission Spectroscopy. Naukova Dumka: Kiev, 1974; 376.
8. Zimkina TM, Fomichev VA. Ultrasoft X-Ray Spectroscopy. LGU: Leningrad, 1971; 132.
9. JCPDS - ICDD, 1995, PDF-2 Sets 1-45 database, Newton Square, PA 19073, USA, card N 29-1484.
10. Zang L, Ivey DG. Can. Metall. Q. 1995; 34: 51.
11. Robertson J. J. Phys. C: Solid State Phys. 1979; 12: 4767.
12. Moreno MS, Egerton RF, Midgly PA. Phys. Rev., B 2005; 71: 035 103.
13. Me Guinness C, Stagaresen CB, Ryan PJ, Downes JE, Fu D, Smith KE. Phys. Rev., B 2003; 68: 16504.
14. Sundaram KB, Bhagavat GK. J. Phys. D: Appl. Phys. 1981; 14: 921.
15. Jae-Ho Chung, Yong-Sahm Choe, Dae-Seung Kim. Thin Solid Films 1999; 349: 126.
16. Sanon G, Rup R, Mansingh A. Phys. Rev., B 1991; 44: 5672.
17. Berggren K-F, Sernelius BE. Phys. Rev., B 1981; 24: 1971.
18. Hamberg I, Granqvist CG, Berggren K-F. Phys. Rev., B 1984; 30: 3240.
19. Maki-Jaskari MA, Rantala TT. Phys. Rev., B 2001; 64: 075401.