Analytical techniques for characterization of organic molecular assemblies in molecular electronics devices

Analytica Chimica Acta

Volumn 568, Issue 1-2, 2006, Pages 2-19

  James, Dustin K ^a   Tour, James M ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

Cyclic voltammetry; Goniometry; Inelastic electron tunneling spectroscopy; Infrared spectroscopy; Molecular electronics; Scanning tunneling microscopy; Single wavelength ellipsometry; X ray photoelectron spectroscopy

Indexed keywords

CHARGE TRANSFER; CYCLIC VOLTAMMETRY; ELECTRONIC EQUIPMENT; ELLIPSOMETRY; GONIOMETERS; INFRARED SPECTROSCOPY; ORGANIC ION EXCHANGERS; PROBES; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANALYTICAL TECHNIQUES; INELASTIC ELECTRON TUNNELING SPECTROSCOPY; MOLECULAR ELECTRONICS; ORGANIC MOLECULAR ASSEMBLIES;

MOLECULAR PHYSICS;

ANALYTIC METHOD; ARTICLE; BIOMOLECULAR ELECTRONICS; CYCLIC POTENTIOMETRY; ELLIPSOMETRY; GONIOMETRY; INELASTIC ELECTRON TUNNELING SPECTROSCOPY; INFRARED SPECTROSCOPY; MOLECULAR PROBE; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SCIENTIFIC LITERATURE; SPECTROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33646578451     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2005.12.032     Document Type: Article

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