Thickness determination of large-area films of yttria-stabilized zirconia produced by pulsed laser deposition

Applied Surface Science

Volumn 252, Issue 13 SPEC. ISS., 2006, Pages 4882-4885

  Pryds, N ^a   Toftmann, B ^a   Bilde Sorensen J B ^a   Schou, J ^a   Linderoth, S ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Large area deposition; Pulsed laser deposition (PLD); Solid oxide fuel cells (SOFC); Yttria stabilized zirconia (YSZ)

Indexed keywords

COMPUTER SIMULATION; MONTE CARLO METHODS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; THICKNESS MEASUREMENT; X RAY SPECTROMETERS;

ELECTRON-INDUCED X-RAYS; LARGE-AREA DEPOSITION; SOLID OXIDE FUEL CELLS (SOFC); YTTRIA-STABILIZED ZIRCONIA (YSZ);

ZIRCONIA;

EID: 33646561881     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.145     Document Type: Article

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