Electron microscopy of γ-irradiated polyethylene

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 552-556

  Bercia, R ^a   Tirnovan, M ^a   Bercia, C ^a   Popescu Pogrion, N ^b  

^a UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

irradiation; Ageing and laser irradiation; Electron microscopy; Polyethylene thin films; Structural transformation

Indexed keywords

CRYSTALS; DIELECTRIC PROPERTIES; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IRRADIATION; LASER BEAM EFFECTS; OPTICAL MICROSCOPY; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

AGEING AND LASER IRRADIATION; POLYETHYLENE THIN FILMS; SELECTED AREA ELECTRON DIFFRACTION; STRUCTURAL TRANSFORMATION;

POLYETHYLENES;

EID: 33646558293     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2275     Document Type: Conference Paper

References (4)

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2. Popescu-Pogrion N, Tirnovan M. Thin Solid Films 1998; 317: 232.
3. Godehardt R, Heydenreich J, Popescu-Pogrion N, Tirnovan M. European Conference on Macromolecular Physics - Proceedings of the Surface and Interface in Polymer and Composites, Pick R (ed.). Lausanne, 1997; 301.
4. Chipara M, Grecu VV, Ifrim A, Chipara M, Popescu-Pogrion N, lonescu A, Notingher P. Le Vide, Les Couches Minces 1992; 200:323.