Structural characterization and magnetoresistance of manganates thin films and Fe-doped manganates thin films

Applied Surface Science

Volumn 252, Issue 13 SPEC. ISS., 2006, Pages 4599-4603

  Canulescu, S ^a   Lippert, Th ^a   Grimmer, H ^a   Wokaun, A ^a   Robert, R ^b   Logvinovich, D ^b   Weidenkaff, A ^b   Doebeli, M ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Fe doped manganates thin films; Magnetoresistance; Manganates thin films; Pulsed laser deposition

Indexed keywords

BACKSCATTERING; IRON; LASER ABLATION; MAGNETORESISTANCE; PEROVSKITE; PULSED LASER DEPOSITION; SEMICONDUCTOR DOPING; X RAY DIFFRACTION;

COLOSSAL MAGNETORESISTANCE RATIO (CMR); FE-DOPED MANGANATES THIN FILMS; FILM STOICHIOMETRY; OXYGEN CONTENT INFLUENCES;

MAGNETIC THIN FILMS;

EID: 33646550230     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.151     Document Type: Article

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