Texture gradient in ECAP silver measured by synchrotron radiation

Materials Science Forum

Volumn 495-497, Issue PART 1, 2005, Pages 821-826

  Skrotzki, W ^a   Scheerbaum, N ^a   Oertel, C G ^a   Brokmeier, H G ^b   Suwas, S ^c,d   Toth L S ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

^c UNIVERSITÉ DE LORRAINE   (France)

^d RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

ECAP; Microstructure; Silver; Synchrotron radiation; Texture

Indexed keywords

EQUAL CHANNEL ANGULAR PRESSING; EXTRUSION; MICROSTRUCTURE; SHEAR DEFORMATION; SYNCHROTRON RADIATION;

HIGH-ENERGY SYNCHROTRON RADIATION; TEXTURE GRADIENTS;

SILVER;

EID: 33646542928     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-975-x.821     Document Type: Conference Paper

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