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Volumn 46, Issue 10, 2006, Pages 1079-1086
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Reverse engineering of free-form surfaces: A methodology for threshold definition in selective sampling
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Author keywords
Geometric morphology; Reverse engineering; Scanning strategy
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Indexed keywords
ALGORITHMS;
AUTOMATIC PROGRAMMING;
COMPUTER SOFTWARE;
COORDINATE MEASURING MACHINES;
INDUSTRIAL APPLICATIONS;
INTERFEROMETRY;
PRODUCT DEVELOPMENT;
REVERSE ENGINEERING;
SAMPLING;
SCANNING;
FREE-FORM SURFACES;
LOCAL CURVATURE VARIATION;
MATHEMATICAL EXPRESSIONS;
SURFACES;
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EID: 33646525700
PISSN: 08906955
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ijmachtools.2005.08.007 Document Type: Article |
Times cited : (25)
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References (11)
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