-
1
-
-
0035364878
-
On the mobility versus drain current relation for a nanoscale MOSFET
-
Lundstrom M. On the mobility versus drain current relation for a nanoscale MOSFET. IEEE Electron Dev Lett 22 6 (2001) 293-295
-
(2001)
IEEE Electron Dev Lett
, vol.22
, Issue.6
, pp. 293-295
-
-
Lundstrom, M.1
-
2
-
-
0035249213
-
Nonstationary electron/hole transport in sub-0.1 μm MOS devices: correlation with mobility and low-power CMOS application
-
Ohba R., and Mizuno T. Nonstationary electron/hole transport in sub-0.1 μm MOS devices: correlation with mobility and low-power CMOS application. IEEE Trans Electron Dev 48 2 (2001) 338-343
-
(2001)
IEEE Trans Electron Dev
, vol.48
, Issue.2
, pp. 338-343
-
-
Ohba, R.1
Mizuno, T.2
-
3
-
-
0015650818
-
Investigation of the MOST channel conductance in weak inversion
-
Koomen J. Investigation of the MOST channel conductance in weak inversion. Solid-State Electron 16 7 (1973) 801-810
-
(1973)
Solid-State Electron
, vol.16
, Issue.7
, pp. 801-810
-
-
Koomen, J.1
-
4
-
-
0023998758
-
New method for the extraction of MOSFET parameters
-
Ghibaudo G. New method for the extraction of MOSFET parameters. Electron Lett 24 (1988) 543-545
-
(1988)
Electron Lett
, vol.24
, pp. 543-545
-
-
Ghibaudo, G.1
-
5
-
-
20144386603
-
New magnetoresistance method for mobility extraction in scaled fully-depleted SOI devices
-
Gallon C., et al. New magnetoresistance method for mobility extraction in scaled fully-depleted SOI devices. Proc Int SOI Conf (2004) 153-155
-
(2004)
Proc Int SOI Conf
, pp. 153-155
-
-
Gallon, C.1
-
6
-
-
33646499494
-
-
Chaisantikulwat W et al., Magnetoresistance mobility measurements in Gate-All-Around SON MOSFETs. In: Proc 1st EuroSOI conference; 2005.
-
-
-
-
7
-
-
36549102250
-
Schottky-barrier profiling techniques in semiconductors: gate current and parasitic effects
-
Look D.C. Schottky-barrier profiling techniques in semiconductors: gate current and parasitic effects. J Appl Phys 57 1 (1985) 377-383
-
(1985)
J Appl Phys
, vol.57
, Issue.1
, pp. 377-383
-
-
Look, D.C.1
-
8
-
-
9944253353
-
Magnetoresistance characterization of nanometer Si metal-oxide-semiconductor transistors
-
Meziani Y.M., et al. Magnetoresistance characterization of nanometer Si metal-oxide-semiconductor transistors. J Appl Phys 96 11 (2004) 5761-5765
-
(2004)
J Appl Phys
, vol.96
, Issue.11
, pp. 5761-5765
-
-
Meziani, Y.M.1
-
9
-
-
33646512888
-
Transport in the inversion layer of a MOS transistor: use of Kubo-Greenwood formalism
-
Ghibaudo G. Transport in the inversion layer of a MOS transistor: use of Kubo-Greenwood formalism. J Phys C: Solid State Phys 19 (1986) 767-780
-
(1986)
J Phys C: Solid State Phys
, vol.19
, pp. 767-780
-
-
Ghibaudo, G.1
-
10
-
-
0028749409
-
A comprehensive study of MOSFET electron mobility in both weak and strong inversion regimes
-
Koga J., Takagi S., and Toriumi A. A comprehensive study of MOSFET electron mobility in both weak and strong inversion regimes. IEDM Tech Dig (1994) 475-478
-
(1994)
IEDM Tech Dig
, pp. 475-478
-
-
Koga, J.1
Takagi, S.2
Toriumi, A.3
-
11
-
-
0000592350
-
Magnetoconductance due to parallel magnetic fields in silicon inversion layer
-
Mensz P.M., and Wheeler R.G. Magnetoconductance due to parallel magnetic fields in silicon inversion layer. Phys Rev B 35 (1987) 2844-2853
-
(1987)
Phys Rev B
, vol.35
, pp. 2844-2853
-
-
Mensz, P.M.1
Wheeler, R.G.2
-
12
-
-
0000191960
-
0.75N/GaN modulation-doped field-effect transistors
-
0.75N/GaN modulation-doped field-effect transistors. J Appl Phys 87 4 (2000) 3900-3904
-
(2000)
J Appl Phys
, vol.87
, Issue.4
, pp. 3900-3904
-
-
Antoszewski, J.1
-
13
-
-
0017466169
-
Very small MOSFET's for low-temperature operation
-
Gaensslen F.H., et al. Very small MOSFET's for low-temperature operation. IEEE Trans Electron Dev ED-24 3 (1977) 218-229
-
(1977)
IEEE Trans Electron Dev
, vol.ED-24
, Issue.3
, pp. 218-229
-
-
Gaensslen, F.H.1
|