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Volumn 416, Issue 1-2, 2006, Pages 155-159
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TEM observation of coexistent Heusler and half-Heusler phases in TiNi1.5Sn
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Author keywords
Half Heusler; High resolution electron microscopy; Thermoelectric material; Transmission electron microscopy; X ray diffraction
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Indexed keywords
ELECTRON MICROSCOPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HEAT TREATMENT;
MICROSTRUCTURE;
THERMOELECTRICITY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
HALF-HEUSLER;
HIGH-RESOLUTION ELECTRON MICROSCOPY;
THERMOELECTRIC MATERIAL;
TITANIUM COMPOUNDS;
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EID: 33646509430
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2005.08.043 Document Type: Article |
Times cited : (6)
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References (8)
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