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Volumn 416, Issue 1-2, 2006, Pages 155-159

TEM observation of coexistent Heusler and half-Heusler phases in TiNi1.5Sn

Author keywords

Half Heusler; High resolution electron microscopy; Thermoelectric material; Transmission electron microscopy; X ray diffraction

Indexed keywords

ELECTRON MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; MICROSTRUCTURE; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33646509430     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.08.043     Document Type: Article
Times cited : (6)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.