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Volumn 25, Issue 1, 2006, Pages 49-55

Methods for quantification of mass emissions from leaking process equipment when using optical imaging for leak detection

Author keywords

Emission reduction; Fugitive emissions; Leak detection and repair; Optical imaging; Smart LDAR; VOC emissions

Indexed keywords

FUGITIVE EMISSIONS; LEAK DETECTION AND REPAIR; SMART LDAR; VOC EMISSIONS;

EID: 33646497713     PISSN: 02784491     EISSN: 10982280     Source Type: Trade Journal    
DOI: 10.1002/ep.10102     Document Type: Article
Times cited : (11)

References (15)
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  • 3
    • 0004903941 scopus 로고
    • EPA-453/R-95-017. Research Triangle Park, NC: Office of Air and Radiation, Office of Air Quality Planning and Standards
    • U.S. Environmental Protection Agency (US EPA). (1995). 1995 Protocol for equipment leak emission estimates, EPA-453/R-95-017. Research Triangle Park, NC: Office of Air and Radiation, Office of Air Quality Planning and Standards.
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  • 5
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  • 6
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    • Los Angeles refinery fugitive emissions: Have they changed after six years of LDAR?
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    • Taback, H.J., Siegell, J.H., & Ritter, K. (1997). Los Angeles refinery fugitive emissions: Have they changed after six years of LDAR?, AWMA/EPA Specialty Conference, The emissions inventory: Planning for the future, Research Triangle Park, NC, October.
    • (1997) AWMA/EPA Specialty Conference
    • Taback, H.J.1    Siegell, J.H.2    Ritter, K.3
  • 8
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    • Monte Carlo simulation approach for evaluating alternative work practices for equipment leak
    • Research Triangle Park, NC: Office of Air and Radiation, Office of Air Quality Planning and Standards
    • U.S. EPA. (1999). Monte Carlo simulation approach for evaluating alternative work practices for equipment leak, Final Report, Research Triangle Park, NC: Office of Air and Radiation, Office of Air Quality Planning and Standards.
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  • 13
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    • Backscatter absorption gas imaging: A new technique for gas visualization
    • McRae, T., & Kulp, T.J. (1993). Backscatter absorption gas imaging: A new technique for gas visualization, Applied Optics, 32, 4037-4050.
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    • McRae, T.1    Kulp, T.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.