Visual evoked fields in patients of unilateral spatial neglect

International Congress Series

Volumn 1278, Issue , 2005, Pages 215-218

  Mizuno, Katsuhiro ^a,b   Tsuji, Tetsuya ^b,c   Masakado, Yoshihisa ^a   Ota, Tetsuo ^a   Honaga, Kaoru ^a,b   Liu, Meigen ^b   Kimura, Akio ^a   Ohde, Hisao ^d  

^a KEIO UNIVERSITY   (Japan)

^b KEIO UNIVERSITY SCHOOL OF MEDICINE   (Japan)

^c SHIZUOKA CANCER CENTER   (Japan)

^d Kamoshita Eye Clinic   (Japan)

Author keywords

Behavioural inattention test (BIT); Magnetoencephalography (MEG); Pattern reversal stimulation; Unilateral spatial neglect; Visual evoked magnetic field (VEF); Visual evoked potential (VEP)

Indexed keywords

EID: 33646461753     PISSN: 05315131     EISSN: None     Source Type: Book Series    
DOI: 10.1016/j.ics.2004.11.078     Document Type: Article

References (6)

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5. Hatanaka K., et al. Source localization of N75-P100-N145 components due to pattern reversal visual evoked potentials. Jpn. J. Electroencephalogr. Electromyogr. 25 (1997) 369-379 (in Japanese)
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