Stress grading materials for cable terminations under fast rise time pulses

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 2, 2006, Pages 430-435

  Espino Cortes, F P ^a,b   Jayaram, S ^a,c,d,e   Cherney, E A ^a,d,e  

^a UNIVERSITY OF WATERLOO   (Canada)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c UNIVERSITY OF WESTERN ONTARIO   (Canada)

^d IEEE

^e IEEE Industry Applications Society ^*

Author keywords

Cable termination; Fast rise time pulses; Field dependent conductivity; PWM VSC; Semiconductive screen; Stress grading coating; Varistor material

Indexed keywords

FAST RISE TIME PULSES; SEMICONDUCTIVE SCREEN; STRESS GRADING MATERIALS; VARISTOR MATERIAL;

COATINGS; FINITE ELEMENT METHOD; SEMICONDUCTOR MATERIALS; STRESS ANALYSIS; TERMINALS (ELECTRIC); TRANSIENTS;

ELECTRIC CABLES;

EID: 33646435115     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1624289     Document Type: Article

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