Second-order aberration corrected electron energy loss spectroscopy attachment for scanning electron microscopes

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Luo, T ^a   Khursheed, A ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; GEOMETRY; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS;

GEOMETRIC ABERRATION; SCANNING ELECTRON MICROSCOPES (SEM); TRANSMISSION ELECTRON MICROSCOPES (TEM);

ELECTRON MICROSCOPES;

EID: 33646422763     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2190208     Document Type: Article

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