A unified predictive TFT model with capability for statistical simulation

2001 International Semiconductor Device Research Symposium, ISDRS 2001 - Proceedings

Volumn , Issue , 2001, Pages 657-660

  Singh, J ^a   Zhang, Shengdong ^a   Wang, Hongmei ^a   Chan, Mansun ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; POLYSILICON; RECONFIGURABLE HARDWARE; SEMICONDUCTOR DEVICES; THIN FILM CIRCUITS;

DEVICE VARIATIONS; FABRICATION TECHNOLOGIES; INDUSTRIAL STANDARDS; PERFORMANCE VARIATIONS; POLYSILICON GRAIN SIZE; POLYSILICON GRAINS; POLYSILICON THIN FILM TRANSISTORS; STATISTICAL SIMULATION;

THIN FILM TRANSISTORS;

EID: 33646410548     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2001.984607     Document Type: Conference Paper

References (2)

1. A. Wang, and K. Saraswat, 1998 IEDM, pp. 277-280
2. BSIM3 manual, U.C. Berkeley, 1995