Simple way to determine the edge of an electron-free sheath with an emissive probe

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Wang, X ^a,b   Hershkowitz, N ^a  

^a University of Wisconsin Madison   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-FREE SHEATH; EMISSIVE PROBE; INFLECTION POINT;

EDGE DETECTION; ELECTRON EMISSION; ELECTRONS; PROBES;

PLASMA SHEATHS;

EID: 33646410435     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2195103     Document Type: Article

References (5)

1. P. Coakley and N. Hershkowitz, Phys. Fluids 22, 1171 (1979).
2. E. Y. Wang, N. Hershkowitz, T. Intrator, and C. Forest, Rev. Sci. Instrum. 57, 2425 (1986).
3. R. E. Kemp and J. M. Sellen, Rev. Sci. Instrum. 37, 455 (1966).
4. J. R. Smith, N. Hershkowitz, and P. Coakley, Rev. Sci. Instrum. 50, 210 (1979).
5. M. A. Lieberman and A. J. Lichtenberg, Principles of Plasma Discharges and Materials Processing (Wiley, New York, 1994), p. 166.