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Volumn 7, Issue 1, 2006, Pages 24-28

Infection assessment of totally implanted long-term venous access devices

Author keywords

Catheter related infections; Infection assessment; Port content culture

Indexed keywords

SILICON;

EID: 33646394054     PISSN: 11297298     EISSN: None     Source Type: Journal    
DOI: 10.1177/112972980600700105     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.