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Volumn 48, Issue 4 I, 2006, Pages 801-805
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Energy spread effects in the PAL XFEL
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Author keywords
Energy spread; Micro bunching instability; PAL XFEL; Transverse coherency
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Indexed keywords
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EID: 33646389274
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (18)
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