On the correlation between void-species structure of vitreous arsenic selenide studied with X-ray diffraction and positron annihilation techniques

Journal of Non-Crystalline Solids

Volumn 352, Issue 6-7 SPEC. ISS., 2006, Pages 700-703

  Shpotyuk, O ^a,b   Kozdras, A ^c   Kavetskyy, T ^a,d   Filipecki, J ^b  

^a Lviv Scientific Research Institute of Materials of SRC Carat   (Ukraine)

^b JAN DLUGOSZ UNIVERSITY   (Poland)

^c OPOLE UNIVERSITY OF TECHNOLOGY   (Poland)

^d DROHOBYCH IVAN FRANKO STATE PEDAGOGICAL UNIVERSITY   (Ukraine)

Author keywords

Chalcogenides; Long range order; Medium range order; Short range order; X ray diffraction

Indexed keywords

ARSENIC; CORRELATION METHODS; MATHEMATICAL MODELS; POSITRON ANNIHILATION SPECTROSCOPY; SELENIUM; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CHALCOGENIDES; LONG RANGE ORDER; MEDIUM RANGE ORDER; SHORT RANGE ORDER;

INTERMETALLICS;

EID: 33646387161     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.11.054     Document Type: Article

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