Comparison of organic thin films deposited by supersonic molecular-beam epitaxy and organic molecular-beam epitaxy: The case of titanyl phthalocyanine

Surface Science

Volumn 600, Issue 10, 2006, Pages 2064-2069

  Walzer, K ^a   Toccoli, T ^b   Pallaoro, A ^b   Iannotta, S ^b   Wagner, C ^a   Fritz, T ^a   Leo, K ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b CNR   (Italy)

Author keywords

Atomic force microscopy; Molecular beam epitaxy; Polycrystalline thin films; Semiconducting films; Single crystal epitaxy

Indexed keywords

ATOMIC FORCE MICROSCOPY; KINETIC ENERGY; MOLECULAR BEAM EPITAXY; MOLECULAR DYNAMICS; ORGANIC COMPOUNDS; SEMICONDUCTING FILMS;

POLYCRYSTALLINE THIN FILMS; SINGLE CRYSTAL EPITAXY; TITANYL PHTHALOCYANINE;

THIN FILMS;

EID: 33646376437     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.02.039     Document Type: Article

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