Sub-micron particle organization by self-imaging of non-diffracting beams

New Journal of Physics

Volumn 8, Issue , 2006, Pages

  Čižmár, Tomáš ^a   Kollárová, Věra ^b   Boucha, Zdeněk ^b   Zemánek, Pavel ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b PALACKÝ UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRON DIFFRACTION; LIGHT INTERFERENCE; LIGHT PROPAGATION; LIGHT VELOCITY;

BESSEL BEAMS; OPTICAL TRAPPING; PROPAGATION CONSTANTS;

HIGH ENERGY PHYSICS;

EID: 33646375473     PISSN: 13672630     EISSN: 13672630     Source Type: Journal    
DOI: 10.1088/1367-2630/8/3/043     Document Type: Article

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