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Volumn 4, Issue , 2006, Pages 431-434
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Energy-filtered PEEM imaging of polycrystalline Cu surfaces with work function contrast and high lateral resolution
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Author keywords
Copper; Photoelectron emission microscopy (PEEM); Polycrystalline surfaces; Work function
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Indexed keywords
COPPER;
NANOTECHNOLOGY;
PHOTOELECTRON SPECTROSCOPY;
PHOTOEMISSION;
POLYCRYSTALLINE MATERIALS;
ULTRAVIOLET DEVICES;
PHOTOELECTRON EMISSION MICROSCOPY (PEEM);
PHOTOEMISSION THRESHOLDS;
POLYCRYSTALLINE SURFACES;
WORK FUNCTIONS;
IMAGING TECHNIQUES;
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EID: 33646361081
PISSN: 13480391
EISSN: 13480391
Source Type: Journal
DOI: 10.1380/ejssnt.2006.431 Document Type: Article |
Times cited : (11)
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References (12)
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