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Volumn 4, Issue , 2006, Pages 431-434

Energy-filtered PEEM imaging of polycrystalline Cu surfaces with work function contrast and high lateral resolution

Author keywords

Copper; Photoelectron emission microscopy (PEEM); Polycrystalline surfaces; Work function

Indexed keywords

COPPER; NANOTECHNOLOGY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; ULTRAVIOLET DEVICES;

EID: 33646361081     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2006.431     Document Type: Article
Times cited : (11)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.