An experiment to profile the voltage, current and temperature behaviour of a P-N diode

European Journal of Physics

Volumn 27, Issue 3, 2006, Pages 625-633

  Ocaya, R O ^a  

^a NORTH WEST UNIVERSITY   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT DISTRIBUTION; ELECTRIC EXCITATION; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; SEMICONDUCTOR DIODES; SILICON; TEMPERATURE DISTRIBUTION; THERMOMETERS;

CURRENT PROFILES; DIODE TEMPERATURES; DIODE VOLTAGES; TEMPERATURE BEHAVIOR;

ELECTRIC POWER DISTRIBUTION;

EID: 33646359216     PISSN: 01430807     EISSN: 13616404     Source Type: Journal    
DOI: 10.1088/0143-0807/27/3/015     Document Type: Article

References (11)

1. Shockley W 1976 Electrons and Holes in Semiconductors (New York: Krieger)
2. Dallas Semiconductor (MAXIM) 2002 Compensating for ideality factor and series resistance in thermal diodes Application Note 1057
3. Van Zeghbroeck B 2004 Principles of Semiconductor Devices http://ece-www.colorado.edu/bart/book/
4. Diodes Incorporated Datasheet DS12019 Rev.B-2 http://www.diodes.com/ datasheets/ds12019.pdf
5. Horowitz P and Hill W 1989 The Art of Electronics 2nd edn (Cambridge: Cambridge University Press) p 220
6. Richardson T 2002 Modeling Diode Circuits with MicroCap 7.0 http://faculty.evansville.edu/ar63/courses/Tutorials/ (University of Evansville, IN)
7. Sze S M 1969 The Physics of Semiconductor Devices (New York: Wiley)
8. Yang E S 1978 Fundamentals of Semiconductor Devices (New York: McGraw-Hill)
9. Waltham N R, Clark G F and Tanner B K 1981 Low temperature thermometry using inexpensive silicon diodes Phys. Educ. 16 104-7
10. Kirkup L and Tonthat C 1999 A direct reading thermometer based on a silicon diode Phys. Educ. 33 302-5
11. Fraser D A 1986 The Physics of Semiconductor Devices (Oxford Physics Series) 4th edn (Oxford: Clarendon)