Wavelet - Based image matching for different sensor

International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives

Volumn 33, Issue , 2000, Pages 177-182

  Chen, Ying ^a  

^a TONGJI UNIVERSITY   (China)

Author keywords

Detection; Edge feature; Line moment; Matching; Wavelet

Indexed keywords

DATA HANDLING; EDGE DETECTION; ERROR DETECTION;

DETECTION APPROACH; EDGE FEATURES; FEATURE PARAMETERS; GRAY CHARACTERISTICS; MATCHING; MATCHING ALGORITHM; WAVELET; WAVELET-BASED IMAGES;

REMOTE SENSING;

EID: 33646254004     PISSN: 16821750     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Mallat S, Hwang W L. Singularity Detection and Processing with Wavelet. IEEE Trans. On Information Theory Vol. 38, No. 2, March 1992, 617-643.
2. Jinfei Wang: LIND - A System for Automated Linear Feature Detection and Analysis. CANADIAN Journal of Remote Sensing, 1993.
3. Lide Wu: Computer Vision, The Publish House of FuDan University, China, 1993.
4. Hui Li, B.S. Manjunath, S.K. Mitra: A Contour-Based Approach to Multisensor Image Registration. IEEE Transactions on Image Processing, vol. 4, No. 3, 3. 1995.
5. W. Wen and A. Lozzi: Recognition and Inspection of Manufactured Parts Using Line Moment of Their Rounders PR. Vol. 26, No. 10, 1993, pp 1461-1471.
6. Ying Chen, A Real Time Image Matching Based on Wavelet. Journal of Image and Graphics 1998. 12, pp 1011-1014
7. Ying Chen, A feature-based and least square Image matching with Costraints. Journal of Image and graphics 1998. 4, pp 299-303