An optimized test sequence satisfying the completeness criteria

Proceedings - 12th International Conference on Information Networking, ICOIN 1998

Volumn , Issue , 1998, Pages 621-625

  Son, Hongse ^a   Nyang, Daehun ^b   Lim, Sangyong ^b   Park, Jinho ^b   Choe, Young Han ^a   Chin, Byungmun ^a   Song, Jooseok ^b  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT COVERAGES; K-STRONG; OUTPUT FAULTS; TEST SEQUENCE; TEST SEQUENCE GENERATIONS;

TESTING;

EID: 33646249492     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICOIN.1998.648477     Document Type: Conference Paper

References (11)

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