A study of FIB-patterned discrete track recording media by spinstand read/write testing and scanning probe microscopy

Journal of Magnetism and Magnetic Materials

Volumn 303, Issue 2 SPEC. ISS., 2006, Pages

  Chen, Y J ^a   Leong, S H ^a   Ng, K W ^a   Guo, Z B ^a   Shi, J Z ^a   Zhao, J M ^a   Liu, B ^a  

^a DATA STORAGE INSTITUTE   (Singapore)

Author keywords

Discrete track recording; Focussed ion beam; Magnetic force microscopy; Magnetic media; Spinstand

Indexed keywords

ION BEAMS; MAGNETIC PROPERTIES; SIGNAL PROCESSING; SURFACE TOPOGRAPHY;

DISCRETE TRACK RECORDING; FOCUSSED ION BEAM; MAGNETIC FORCE MICROSCOPY; SPINSTAND;

MAGNETIC RECORDING;

EID: 33646247619     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.01.121     Document Type: Article

References (3)

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3. Soeno Y., Moriya M., Ito K., Hattori K., Kaizu A., Aoyama T., Matsuzaki M., and Sakai H. IEEE Trans. Magn. 39 (2003) 1967