A CMOS watchdog sensor for certifying the quality of various perishables with a wider activation energy

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E89-A, Issue 4, 2006, Pages 902-907

  Ueno, Ken ^a   Hirose, Tetsuya ^a   Asai, Tetsuya ^a   Amemiya, Yoshihito ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

CMOS; Low power; Quality guarantee; Sensor; Subthreshold; Translinear

Indexed keywords

ACTIVATION ENERGY; CMOS INTEGRATED CIRCUITS; COMMUNICATION SYSTEMS; COMPUTER SCIENCE; ELECTRIC POWER UTILIZATION; QUALITY CONTROL;

LOW POWER; QUALITY GUARANTEE; SUBTHRESHOLD; TRANSLINEAR;

SENSORS;

EID: 33646240335     PISSN: 09168508     EISSN: 17451337     Source Type: Journal    
DOI: 10.1093/ietfec/e89-a.4.902     Document Type: Conference Paper

References (6)

1. T. Hirose, R. Yoshimura, T. Ido, T. Matsuoka, and K. Taniguchi, "Watch-dog circuit for quality guarantee with subthreshold MOSFET current," IEICE Trans. Electron., vol.E87-C, no.11, pp.1910-1914, Nov. 2004.
2. T. Hirose, R. Yoshimura, T. Ido, T. Matsuoka, and K. Taniguchi, "Watchdog circuit for product degradation monitor using subthreshold MOS current," Proc. Int. Conf. on Solid State Devices and Materials, pp.150-151, Sept. 2004.
3. P.W. Atkins, Physical Chemistry, sixth ed., Oxford University Press, 1998.
4. P.R. Gray and R.G. Meyer, Analysis and Design of Analog Integrated Circuits, third ed., Wiley & Sons. 1993.
5. S.-C. Liu, J. Kramer, G. Indiveri, T. Delbruck, and R. Douglas, Analog VLSI: Circuits and principles, MIT Press. 2002.
6. E.S. -Sinencio and A.G. Andreou, Low-Voltage/Low-Power Integrated Circuits and Systems, IEEE, 1999.