Prediction of monochrome reflectance spectra with an extended Kubelka-Munk model

Final Program and Proceedings - IS and T/SID Color Imaging Conference

Volumn , Issue , 2002, Pages 298-304

  Mourad, Safer ^b   Emmel, Patrick ^b   Simon, Klaus ^b   Hersch, Roger David ^a  

^a EPFL   (Switzerland)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (OPTICAL); ERROR ANALYSIS; LIGHT SCATTERING; PHOTOGRAPHIC EQUIPMENT;

ELECTROPHOTOGRAPHY;

PRINTERS (COMPUTER);

EID: 33646214091     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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