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Volumn 117, Issue 6, 2006, Pages 287-295

Aberrations of self-imaged patterns with two-dimensional periodicity

Author keywords

Aberrations; Crossed line grating; Self image; Talbot effect

Indexed keywords

ABERRATIONS; IMAGING TECHNIQUES; LENSES; OPTICAL SYSTEMS; RAY TRACING; WAVEFRONTS;

EID: 33646165630     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2005.08.019     Document Type: Article
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.