Determination of antisite defects in double perovskite Sr2FeMoO6 by diffraction method: Simulation studies

Solid State Communications

Volumn 138, Issue 6, 2006, Pages 294-298

  Zhang, Q ^a   Liu, G Y ^a   Rao, G H ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

A. Double perovskites; C. Antisite defects; C. Diffraction

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; DATA ACQUISITION; IRON COMPOUNDS; POSITIVE IONS; X RAY POWDER DIFFRACTION;

ANTISITE DEFECTS; DOUBLE PEROVSKITES; RIETVELD TECHNIQUE;

PEROVSKITE;

EID: 33646161219     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2006.03.008     Document Type: Article

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