Reliability testing and qualification of the teraVicta RF MEMS switch

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6111, Issue , 2006, Pages

  McKillop, John S ^a  

^a TeraVicta Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSERTION LOSSES; PARAMETRIC DEVICES; RELIABILITY; SEMICONDUCTOR SWITCHES; STANDARDS;

QUALIFICATION; SEMICONDUCTOR INDUSTRY; TERAVICTA TECHNOLOGIES;

MICROELECTROMECHANICAL DEVICES;

EID: 33646061954     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.648776     Document Type: Conference Paper

References (0)