Easily testable image operators: The class of circuits where evolution beats engineers

Proceedings - NASA/DoD Conference on Evolvable Hardware, EH

Volumn 2003-January, Issue , 2003, Pages 135-144

  Sekanina, L ^a   Ružicka R ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Circuit noise; Circuit synthesis; Circuit testing; Design engineering; Evolutionary computation; Filters; Gaussian noise; Hardware; Image edge detection; Pixel

Indexed keywords

COMPUTER HARDWARE; EDGE DETECTION; EVOLUTIONARY ALGORITHMS; FILTERS (FOR FLUIDS); HARDWARE; NASA; PIXELS; SHOT NOISE;

CIRCUIT NOISE; CIRCUIT SYNTHESIS; CIRCUIT TESTING; DESIGN ENGINEERING; IMAGE EDGE DETECTION;

GAUSSIAN NOISE (ELECTRONIC);

EID: 33646006626     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2003.1217658     Document Type: Conference Paper

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