Preparation and properties of SnO2:F thin films

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 1, 2006, Pages 27-30

  Girtan, M ^a,b   Bouteville, A ^b   Rusu, G G ^a   Rusu, M ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b Arts et Metiers ParisTech   (France)

Author keywords

Reflectance spectrum; SEM; SnO2:F thin films; Transmittance spectrum; XRD

Indexed keywords

LIME; NANOCOMPOSITES; OXIDE FILMS; REFLECTION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; TIN OXIDES; X RAY DIFFRACTION;

FLUORINE-DOPED TIN OXIDE FILMS; HIGH QUALITY; REFLECTANCE SPECTRUM; SODA LIME GLASS SUBSTRATE; SPECTRAL REGION; SPRAY PROCESS; TRANSMITTANCE AND REFLECTANCES; TRANSMITTANCE SPECTRA;

FILM PREPARATION;

EID: 33645963803     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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