A computable formula for the average bit error probability as a function of window size for the IEEE 802.15.3a UWB channel model

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 4, 2006, Pages 1762-1768

  Gubner, John A ^a,b   Hao, Kei ^b  

^a IEEE   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

Cluster process; Lognormal distribution; Point process; Saleh Valenzuela model; Shot noise; Ultra wideband (UWB)

Indexed keywords

CLUSTER PROCESS; LOGNORMAL DISTRIBUTION; POINT PROCESS; SALEH-VALENZUELA MODEL; ULTRA-WIDEBAND (UWB);

COMMUNICATION CHANNELS (INFORMATION THEORY); ERRORS; FINITE AUTOMATA; PERFORMANCE; SIGNAL PROCESSING; SIGNALING; SPURIOUS SIGNAL NOISE;

BIT ERROR RATE;

EID: 33645953649     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.871985     Document Type: Conference Paper

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