|
Volumn 21, Issue 1, 1988, Pages 22-28
|
Simultaneous structure refinement of neutron, synchrotron and X-ray powder diffraction patterns
a a a
a
NONE
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DIFFRACTION;
DIFFRACTOMETERS;
RIETVELD ANALYSIS;
X RAY POWDER DIFFRACTION;
COUNTING RATES;
COUNTING STATISTICS;
GOODNESS OF FIT;
POWDER DIFFRACTION;
SIMULTANEOUS ANALYSIS;
STRUCTURAL MODELING;
STRUCTURE REFINEMENTS;
X-RAY POWDER DIFFRACTOMETERS;
X RAYS;
|
EID: 33645939761
PISSN: 00218898
EISSN: 16005767
Source Type: Journal
DOI: 10.1107/S0021889887008331 Document Type: Article |
Times cited : (34)
|
References (0)
|