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Volumn 40, Issue 4, 2006, Pages 101-102
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Chaos affects atomic force microscopes
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a
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
DITHER PIEZO;
MICROCANTILEVERS;
SILICON PROBES;
CHAOS THEORY;
GRAPHITE;
OSCILLATIONS;
PROBES;
SILICON;
ATOMIC FORCE MICROSCOPY;
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EID: 33645932600
PISSN: 07311230
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (8)
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References (0)
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