Bismuth X-ray absorber studies for TES microcalorimeters

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 559, Issue 2, 2006, Pages 447-449

  Sadleir, J E ^a,b   Bandler, S R ^a   Brekosky, R P ^a   Chervenak, J ^a   Figueroa Feliciano, E ^a   Finkbeiner, F ^a   Iyomoto, N ^a   Kelley, R L ^a   Kilbourne, C A ^a   King, J M ^a   Porter, F S ^a   Robinson, I K ^b   Saab, T ^a   Talley, D J ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Diffusion; In situ resistance annealing; Microcalorimetry; Multilayer strip resistance; Superconducting transition edge sensor (TES); X ray absorber

Indexed keywords

ANNEALING; BISMUTH; CALORIMETERS; DIFFUSION; INTERMETALLICS; THIN FILMS; X RAYS;

IN SITU RESISTANCE ANNEALING; MULTILAYER STRIP RESISTANCE; SUPERCONDUCTING TRANSITION EDGE SENSOR (TES); X-RAY ABSORBER;

SENSORS;

EID: 33645889652     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.12.033     Document Type: Article

References (2)

1. Chervenak J.A., et al. Nucl. Instr. and Meth. A 520 (2004) 460
2. E. Figueroa-Feliciano, et al., these proceedings.